JC

Jifeng Chen

IBM: 1 patents #5,048 of 10,295Top 50%
Overall (2016): #356,707 of 481,213Top 75%
1
Patents 2016

Issued Patents 2016

Patent #TitleCo-InventorsDate
9448277 Integrated time dependent dielectric breakdown reliability testing Dirk Pfeiffer, Thomas M. Shaw, Peilin Song, Franco Stellari 2016-09-20