Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9483819 | Contour-based array inspection of patterned defects | Chien-Huei Chen, Ajay Gupta, Thanh Huy Ha, Jianwei Wang, Christopher Maher +1 more | 2016-11-01 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9483819 | Contour-based array inspection of patterned defects | Chien-Huei Chen, Ajay Gupta, Thanh Huy Ha, Jianwei Wang, Christopher Maher +1 more | 2016-11-01 |