Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9312098 | Method of examining a sample in a charged-particle microscope | Ivan Lazic, Eric Gerardus Theodoor Bosch, Faysal Boughorbel, Kasim Sader, Sorin Lazar | 2016-04-12 |
| 9293297 | Correlative optical and charged particle microscope | — | 2016-03-22 |