Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9312098 | Method of examining a sample in a charged-particle microscope | Ivan Lazic, Faysal Boughorbel, Bart Buijsse, Kasim Sader, Sorin Lazar | 2016-04-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9312098 | Method of examining a sample in a charged-particle microscope | Ivan Lazic, Faysal Boughorbel, Bart Buijsse, Kasim Sader, Sorin Lazar | 2016-04-12 |