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Faysal Boughorbel

FE Fei: 2 patents #11 of 108Top 15%
Overall (2016): #144,261 of 481,213Top 30%
2
Patents 2016

Issued Patents 2016

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9478393 Computational scanning microscopy with improved resolution Pavel Potocek, Berend Helmerus Lich, Matthias Langhorst 2016-10-25
9312098 Method of examining a sample in a charged-particle microscope Ivan Lazic, Eric Gerardus Theodoor Bosch, Bart Buijsse, Kasim Sader, Sorin Lazar 2016-04-12