| 9471732 |
Equivalent device statistical modeling for bitline leakage modeling |
Rouwaida N. Kanj, Sani R. Nassif |
2016-10-18 |
| 9460243 |
Selective importance sampling |
Rouwaida N. Kanj, Pranita Kerber |
2016-10-04 |
| 9454629 |
Fet-bounding for fast TCAD-based variation modeling |
Rouwaida N. Kanj, Keunwoo Kim |
2016-09-27 |
| 9411921 |
FET-bounding for fast TCAD-based variation modeling |
Rouwaida N. Kanj, Keunwoo Kim |
2016-08-09 |
| 9385025 |
E-fuses containing at least one underlying tungsten contact for programming |
Chih-Chao Yang |
2016-07-05 |
| 9348680 |
Statistical design with importance sampling reuse |
Rouwaida N. Kanj, Sani R. Nassif, Carl Radens |
2016-05-24 |
| 9336343 |
Calculating circuit-level leakage using three dimensional technology computer aided design and a reduced number of transistors |
Keunwoo Kim |
2016-05-10 |
| 9262575 |
Circuit-level abstraction of multigate devices using two-dimensional technology computer aided design |
Keunwoo Kim |
2016-02-16 |
| 9256704 |
Efficient deployment of table lookup (TLU) in an enterprise-level scalable circuit simulation architecture |
Emrah Acar, Tong Li |
2016-02-09 |
