Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9269642 | Methods for testing integrated circuits of wafer and testing structures for integrated circuits | Mark A. DiRocco, Jeffrey P. Gambino, Kirk D. Peterson | 2016-02-23 |
MC
Michael T. Coster
Overall (2016): #293,122 of 481,213Top 65%
1
Patents 2016