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Resistive random access memory cell structure |
Pantas Sutardja, Albert Wu, Peter Wung Lee, Runzi Chang |
2016-11-08 |
| 9424911 |
Method and apparatus for screening memory cells for disturb failures |
Moon-Hae Son, Peter Wung Lee |
2016-08-23 |
| 9324417 |
Systems and methods for avoiding read disturbance in a static random-access memory (SRAM) |
Peter Wung Lee |
2016-04-26 |
| 9275731 |
Systems and methods for increasing the read sensitivity of a resistive random access memory (RRAM) |
Pantas Sutardja, Albert Wu, Runzi Chang, Peter Wung Lee |
2016-03-01 |
| 9250992 |
Test data reporting during memory testing |
Kit S. Tam, Robert Bateman, Kresten V. McGrath, David Lippincott |
2016-02-02 |
| 9245961 |
Reducing source contact to gate spacing to decrease transistor pitch |
Albert Wu, Pantas Sutardja, Peter Wung Lee, Chien-Chuan Wei, Runzi Chang |
2016-01-26 |
