Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7974595 | Methodology for assessing degradation due to radio frequency excitation of transistors | Andrew Marshall, Siraj Akhtar, Srikanth Krishnan, Karan Singh Bhatia | 2011-07-05 |
| 7952378 | Tunable stress technique for reliability degradation measurement | Andrew Marshall | 2011-05-31 |