Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7974595 | Methodology for assessing degradation due to radio frequency excitation of transistors | Vijay Reddy, Andrew Marshall, Siraj Akhtar, Srikanth Krishnan | 2011-07-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7974595 | Methodology for assessing degradation due to radio frequency excitation of transistors | Vijay Reddy, Andrew Marshall, Siraj Akhtar, Srikanth Krishnan | 2011-07-05 |