LW

Lee D. Whetsel

TI Texas Instruments: 71 patents #1 of 1,078Top 1%
📍 Parker, TX: #1 of 9 inventorsTop 15%
🗺 Texas: #1 of 11,512 inventorsTop 1%
Overall (2011): #35 of 364,097Top 1%
71
Patents 2011

Issued Patents 2011

Showing 1–25 of 71 patents

Patent #TitleCo-InventorsDate
8078927 Wrapper leads gating TAP instruction and data registers 2011-12-13
8065578 Inverted TCK access port selector selecting one of plural TAPs 2011-11-22
8065577 Dual controllers for scan paths, distributors, and collectors 2011-11-22
8055967 TAP interface outputs connected to TAP interface inputs 2011-11-08
8055962 Testing IC functional and test circuitry having separate input/output pads Richard L. Antley 2011-11-08
8051351 DDR circuit with addressable TAP linking circuitry and plural TAPS 2011-11-01
8051349 Link instruction register with instruction register, and gate and multiplexer 2011-11-01
8046651 Compare circuit receiving scan register and inverted clock flip-flop data 2011-10-25
8046650 TAP with control circuitry connected to device address port 2011-10-25
8046649 Scan circuits formed peripheral of core circuits with control leads 2011-10-25
8037386 TAP with select output from one of IR and DR 2011-10-11
8037383 Gating circuitry coupling selected scan paths between I/O scan bus 2011-10-11
8028212 Parallel scan paths with header data circuitry and header return circuitry 2011-09-27
8020057 Comparator circuitry connected to input and output of tristate buffer 2011-09-13
8018241 Logic applying different bit positions to respective scan paths 2011-09-13
8020059 Tap and control with data I/O, TMS, TDI, and TDO 2011-09-13
8013634 LVDS data input circuit with multiplexer selecting data out input 2011-09-06
8015464 Segmented scan paths with cache bit memory inputs Joel J. Graber 2011-09-06
8015466 Adapting scan-BIST architectures for low power operation 2011-09-06
8015463 IC with TAP, DIO interface, SIPE, and PISO circuits 2011-09-06
8010857 Input/output boundary cells and output data summing scan cell 2011-08-30
8004298 IC with first and second distributors collectors and scan paths 2011-08-23
8006151 TAP and shadow port operating on rising and falling TCK 2011-08-23
8001436 Changing scan paths shifting by changing mode select input state 2011-08-16
8001435 Register selection circuitry receiving select signals from test interfaces 2011-08-16