Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7979763 | Fully X-tolerant, very high scan compression scan test systems and techniques | Peter Wohl, John A. Waicukauski | 2011-07-12 |
| 7958472 | Increasing scan compression by using X-chains | Peter Wohl, John A. Waicukauski, Yasunari Kanzawa | 2011-06-07 |
| 7900105 | Dynamically reconfigurable shared scan-in test architecture | Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more | 2011-03-01 |