Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7979763 | Fully X-tolerant, very high scan compression scan test systems and techniques | Peter Wohl, Frederic J. Neuveux | 2011-07-12 |
| 7958472 | Increasing scan compression by using X-chains | Peter Wohl, Frederic J. Neuveux, Yasunari Kanzawa | 2011-06-07 |
| 7882410 | Launch-on-shift support for on-chip-clocking | Timothy Ayres, Peter Wohl | 2011-02-01 |