Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8068579 | Process for examining mineral samples with X-ray microscope and projection systems | Michael Feser, Andrei Tkachuk, Thomas A. Case, Frederick W. Duewer, Hauyee Chang | 2011-11-29 |
| 7974379 | Metrology and registration system and method for laminography and tomography | Thomas A. Case, Alan Francis Lyon | 2011-07-05 |
| 7920676 | CD-GISAXS system and method | Yuxin Wang, Srivatsan Seshadri, Kenneth W. Nill | 2011-04-05 |
| 7864426 | High aspect-ratio X-ray diffractive structure stabilization methods and systems | Alan Francis Lyon, Yan Feng | 2011-01-04 |