Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7974379 | Metrology and registration system and method for laminography and tomography | Thomas A. Case, Wenbing Yun | 2011-07-05 |
| 7864426 | High aspect-ratio X-ray diffractive structure stabilization methods and systems | Wenbing Yun, Yan Feng | 2011-01-04 |