Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8068579 | Process for examining mineral samples with X-ray microscope and projection systems | Wenbing Yun, Michael Feser, Andrei Tkachuk, Frederick W. Duewer, Hauyee Chang | 2011-11-29 |
| 7974379 | Metrology and registration system and method for laminography and tomography | Wenbing Yun, Alan Francis Lyon | 2011-07-05 |