JM

Jason McNichols

LS Lsi: 1 patents #116 of 382Top 35%
📍 Portland, OR: #376 of 1,042 inventorsTop 40%
🗺 Oregon: #995 of 2,981 inventorsTop 35%
Overall (2011): #274,402 of 364,097Top 80%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7968859 Wafer edge defect inspection using captured image analysis Roger Y. B. Young, John A. Knoch 2011-06-28