Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7968859 | Wafer edge defect inspection using captured image analysis | Roger Y. B. Young, Jason McNichols | 2011-06-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7968859 | Wafer edge defect inspection using captured image analysis | Roger Y. B. Young, Jason McNichols | 2011-06-28 |