RY

Roger Y. B. Young

LS Lsi: 1 patents #116 of 382Top 35%
📍 Vancouver, WA: #52 of 173 inventorsTop 35%
🗺 Washington: #2,839 of 8,555 inventorsTop 35%
Overall (2011): #177,475 of 364,097Top 50%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7968859 Wafer edge defect inspection using captured image analysis John A. Knoch, Jason McNichols 2011-06-28