Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8073240 | Computer-implemented methods, computer-readable media, and systems for identifying one or more optical modes of an inspection system as candidates for use in inspection of a layer of a wafer | Verlyn Michael Fischer, Harish P. Hiriyannaiah, Younus Vora, Ping Ding, Andrew V. Hill | 2011-12-06 |
| 8000922 | Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm | Hong Chen, Michael J. Van Riet, Chien-Huei Chen, Jason Z. Lin, Michal Kowalski +4 more | 2011-08-16 |