Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8000922 | Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm | Hong Chen, Michael J. Van Riet, Jason Z. Lin, Chris Maher, Michal Kowalski +4 more | 2011-08-16 |
| 7925072 | Methods for identifying array areas in dies formed on a wafer and methods for setting up such methods | Ajay Gupta, Richard Wallingford, Kaustubh (Kaust) Namjoshi, Mike Van Riet, Michael Cook | 2011-04-12 |
| 7894659 | Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer | Xiaoming Wang, Eugene Shifrin, Tsung-Pao Fang | 2011-02-22 |