Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8041103 | Methods and systems for determining a position of inspection data in design data space | Ashok Kulkarni, Brian Duffy, Kais Maayah, Gordon Rouse | 2011-10-18 |
| 7894659 | Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer | Chien-Huei Chen, Xiaoming Wang, Tsung-Pao Fang | 2011-02-22 |