KF

Kaoru Fujiwara

TL Tokyo Electron Limited: 1 patents #261 of 712Top 40%
Overall (2011): #251,989 of 364,097Top 70%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8040504 Defect inspecting method and defect inspecting apparatus Misako Saito, Teruyuki Hayashi 2011-10-18