Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8056023 | Determining manufacturability of lithographic mask by reducing target edge pairs used in determining a manufacturing penalty of the lithographic mask | Tadanobu Inoue, David O. Melville, Hidemasa Muta, Kehan Tian, Alan E. Rosenbluth | 2011-11-08 |
| 8056026 | Determining manufacturability of lithographic mask by selecting target edge pairs used in determining a manufacturing penalty of the lithographic mask | Tadanobu Inoue, David O. Melville, Hidemasa Muta, Kehan Tian, Alan E. Rosenbluth | 2011-11-08 |