Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7989768 | Scanning electron microscope | Akira Ikegami, Minoru Yamazaki, Hideyuki Kazumi, Hisaya Murakoshi | 2011-08-02 |
| 7928377 | Charged particle beam apparatus and sample manufacturing method | Tohru Ishitani, Tsuyoshi Ohnishi, Mitsugu Sato | 2011-04-19 |