ZZ

Zhao-Li Zhang

HM Hermes Microvision: 1 patents #15 of 27Top 60%
📍 San Jose, CA: #1,637 of 4,297 inventorsTop 40%
🗺 California: #14,783 of 41,698 inventorsTop 40%
Overall (2011): #116,888 of 364,097Top 35%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8068662 Method and system for determining a defect during charged particle beam inspection of a sample Wei Fang, Jack Jau 2011-11-29