Issued Patents 2011
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8071474 | Method of manufacturing semiconductor device suitable for forming wiring using damascene method | Noriyoshi Shimizu, Nobuyuki Ohtsuka, Hideki Kitada | 2011-12-06 |
| 8067309 | Semiconductor device using metal nitride as insulating film and its manufacture method | Noriyoshi Shimizu, Hiroki Kondo, Takashi Suzuki, Nobuyuki Nishikawa | 2011-11-29 |
| 8067836 | Semiconductor device with reduced increase in copper film resistance | Masaki Haneda, Noriyoshi Shimizu, Nobuyuki Ohtsuka, Michie Sunayama, Takahiro Tabira | 2011-11-29 |
| 8027796 | S/N ratio measuring method in eddy current testing on internal surface of pipe or tube | Shoji Kinomura, Toshiya Kodai, Shugo Nishiyama | 2011-09-27 |
| 7935624 | Fabrication method of semiconductor device having a barrier layer containing Mn | Nobuyuki Ohtsuka, Noriyoshi Shimizu, Hisaya Sakai | 2011-05-03 |