Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8037761 | Quantitative evaluation device and method of atomic vacancy existing in silicon wafer | Terutaka Goto, Yuichi Nemoto, Masataka Hourai | 2011-10-18 |
| 8017260 | Secondary battery having third terminal other than positive and negative electrode terminals and battery comprising it | Chika Kanbe | 2011-09-13 |
| 7906443 | Controlling oxygen precipitates in silicon wafers using infrared irradiation and heating | Katsuto Tanahashi | 2011-03-15 |