Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7880138 | Apparatus and method for analyzing contaminants on wafer | Heung Bin Lim, Won Ryu, Seung-Ki Chae, Yang-Koo Lee, Hun-Jung Yi | 2011-02-01 |
JL
Jae Seok Lee
Overall (2011): #274,951 of 364,097Top 80%
1
Patents 2011