Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7984399 | System and method for random defect yield simulation of chip with built-in redundancy | Roland Ruehl, Jonathan R. Fales, Udayan Gumaste | 2011-07-19 |
| 7886243 | System and method for using rules-based analysis to enhance models-based analysis | Udayan Gumaste, Roland Ruehl, Harsh Deshmane | 2011-02-08 |