Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8049521 | Solar parametric testing module and processes | Danny Cam Toan Lu, Michel Marriott, Dapeng Wang, Michel R. Frei | 2011-11-01 |
| 7962864 | Stage yield prediction | Youval Nehmadi, Rinat Shimshi, Alexander T. Schwarm, Sundar Jawaharlal | 2011-06-14 |
| 7956337 | Scribe process monitoring methodology | Tzay-Fa Su, Chuck Luu | 2011-06-07 |
| 7937179 | Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects | Rinat Shimshi, Youval Nehmadi, Alexander T. Schwarm, Sundar Jawaharlal | 2011-05-03 |