Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7962864 | Stage yield prediction | Youval Nehmadi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal | 2011-06-14 |
| 7937179 | Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects | Youval Nehmadi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal | 2011-05-03 |