Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7973919 | High resolution wafer inspection system | Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Haim Feldman | 2011-07-05 |
| 7924419 | Illumination system for optical inspection | Avishay Guetta, Haim Feldman, Doron Shoham | 2011-04-12 |