Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7973919 | High resolution wafer inspection system | Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali, Haim Feldman | 2011-07-05 |
DG
Dan Grossman
Overall (2011): #323,503 of 364,097Top 90%
1
Patents 2011