Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7973919 | High resolution wafer inspection system | Dan Grossman, Moshe Langer, Silviu Reinhorn, Ron Naftali, Haim Feldman | 2011-07-05 |
RK
Roman Kris
Overall (2011): #180,785 of 364,097Top 50%
1
Patents 2011