CB

Christin Bartsch

AM AMD: 1 patents #237 of 913Top 30%
📍 Lauterbach, DE: #2 of 3 inventorsTop 70%
Overall (2011): #337,294 of 364,097Top 95%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7986040 Method of reducing erosion of a metal cap layer during via patterning in semiconductor devices Daniel Fischer, Matthias Schaller 2011-07-26