Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8000905 | Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer | Stephanie Chen, Richard Wallingford | 2011-08-16 |
| 8000922 | Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm | Hong Chen, Michael J. Van Riet, Chien-Huei Chen, Jason Z. Lin, Chris Maher +4 more | 2011-08-16 |