Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6956658 | System and method for measuring object characteristics using phase differences in polarized light reflections | Steven W. Meeks | 2005-10-18 |
| 6956660 | System and method for measuring properties of an object using a phase difference between two reflected light signals | Steven W. Meeks | 2005-10-18 |