SJ

Steven Jacobson

NS National Semiconductor: 1 patents #100 of 250Top 40%
📍 New York, NY: #196 of 805 inventorsTop 25%
🗺 New York: #2,313 of 8,003 inventorsTop 30%
Overall (2005): #98,161 of 245,428Top 40%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6937351 Non-destructive method of measuring the thickness of a semiconductor wafer Kevin Weaver, Zachary Joshua Gemmill 2005-08-30