Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6952106 | E-beam voltage potential circuit performance library | William Ng, Zachary Joshua Gemmill | 2005-10-04 |
| 6937351 | Non-destructive method of measuring the thickness of a semiconductor wafer | Zachary Joshua Gemmill, Steven Jacobson | 2005-08-30 |
| 6842021 | System and method for detecting location of a defective electrical connection within an integrated circuit | Gengying Gao | 2005-01-11 |