KB

Keith Brankner

FS Freeescale Semiconductor: 1 patents #149 of 477Top 35%
📍 Richardson, TX: #53 of 203 inventorsTop 30%
🗺 Texas: #2,180 of 8,064 inventorsTop 30%
Overall (2005): #161,378 of 245,428Top 70%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6882745 Method and apparatus for translating detected wafer defect coordinates to reticle coordinates using CAD data David M. Schraub 2005-04-19