Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6882745 | Method and apparatus for translating detected wafer defect coordinates to reticle coordinates using CAD data | Keith Brankner | 2005-04-19 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6882745 | Method and apparatus for translating detected wafer defect coordinates to reticle coordinates using CAD data | Keith Brankner | 2005-04-19 |