Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6930323 | Test keys structure for a control monitor wafer | Hsien-Tsong Chen, Ming-Shuo Yen, Woan Tyng Hwang, Yu-Chang Chen, Tien-Tzu Wen | 2005-08-16 |
SC
Shion-Feng Chang Chien
Overall (2005): #103,935 of 245,428Top 45%
1
Patents 2005