Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6930323 | Test keys structure for a control monitor wafer | Hsien-Tsong Chen, Ming-Shuo Yen, Woan Tyng Hwang, Tien-Tzu Wen, Shion-Feng Chang Chien | 2005-08-16 |
YC
Yu-Chang Chen
Overall (2005): #69,453 of 245,428Top 30%
1
Patents 2005