Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6925202 | System and method of providing mask quality control | Linard Karklin, Linyong Pang | 2005-08-02 |
| 6873720 | System and method of providing mask defect printability analysis | Linard Karklin, Linyong Pang | 2005-03-29 |
| 6870951 | Method and apparatus to facilitate auto-alignment of images for defect inspection and defect analysis | — | 2005-03-22 |