Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6925202 | System and method of providing mask quality control | Linard Karklin, Lynn Cai | 2005-08-02 |
| 6873720 | System and method of providing mask defect printability analysis | Lynn Cai, Linard Karklin | 2005-03-29 |