Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6842028 | Apparatus for testing reliability of interconnection in integrated circuit | Won-sang Song, Jung Woo Kim, Chang-Sub Lee, Sam Young Kim, Ki-Chul Park | 2005-01-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6842028 | Apparatus for testing reliability of interconnection in integrated circuit | Won-sang Song, Jung Woo Kim, Chang-Sub Lee, Sam Young Kim, Ki-Chul Park | 2005-01-11 |