Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6888261 | Alignment mark and exposure alignment system and method using the same | Seong-Il Kim, Sang-Il Han, Chang-Hoon Lee, Choung-Hee Kim | 2005-05-03 |
| 6881630 | Methods for fabricating field effect transistors having elevated source/drain regions | Jung-Woo Park, Gil-Gwang Lee, Tae-Hee Choe | 2005-04-19 |
| 6842028 | Apparatus for testing reliability of interconnection in integrated circuit | Jung Woo Kim, Chang-Sub Lee, Sam Young Kim, Young-Jin Wee, Ki-Chul Park | 2005-01-11 |