Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6912056 | Apparatus and method for measuring each thickness of a multilayer stacked on a substrate | Sun-Jin Kang, Sang-Kil Lee, Kyung-Ho Jung | 2005-06-28 |
PH
Pil-Sik Hyun
Overall (2005): #121,349 of 245,428Top 50%
1
Patents 2005