Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6960265 | Apparatus and method for collecting metallic impurity on a semiconductor wafer | Yong-Woo Heo, Mi Kyoung Lee, Hyun-Gi Cho | 2005-11-01 |
JG
June-Ing Gill
Overall (2005): #166,685 of 245,428Top 70%
1
Patents 2005